Thin Films

Investigation of Lattice Mismatch Stress in SoS Thin Film Systems by the Raman Scattering and XRD Techniques 
M Liu, HH Ruan and LC Zhang, Characterization of residual stress distribution in SoS thin film systems by the raman scattering technique, The 7th International Conference on Advances and Trends in Engineering Materials and their Applications (AES-ATEMA’2011), 4-8 July 2011, Milan, Italy.

Finite element simulation of stresses induced by thermal and lattice mismatch in thin films
A Moridi,  HH Ruan,  LC Zhang and M Liu, Finite element simulation of stresses induced by thermal and lattice mismatch in thin films, The 7th International Conference on Advances and Trends in Engineering Materials and their Applications (AES-ATEMA’2011), 4-8 July 2011, Milan, Italy.

Residual stresses in silicon-on-sapphire thin film systems Download »
A Pramanik and LC Zhang, International Journal of Solids & Structures, 48 (2011) 1290-1300.

Determining the Complete Residual Stress Tensors in SOS Heteroepitaxial Thin Film Systems by the Technique of X-Ray Diffraction Download »
Mei Liu, L.C. Zhang, Andrew Brawley, Petar Atanackovic and Steven Duvall, Key Engineering Materials 443 (2010) pp 742-747

Production, Characterization and Application of Silicon-on-sapphire Wafers Download »
Alokesh Pramanik, Mei Liu and L.C. Zhang. Key Engineering Materials   443 (2010) pp 567-572

Origin of friction in films of horizontally oriented carbon nanotubes sliding against diamond Download »
K Mylvaganam, LC Zhang and K Xiao, Carbon, 47 (2009) 1693-1700.

Residual stress induced atomic scale buckling of diamond carbon coatings on silicon substrate Download »
K Mylvanagam and LC Zhang, Thin Solid Films, 425 (2003) 145-149.